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光学仪器及设备
Fischione轴上旋转三维重构样品杆2050
Fischione三维重构真空转移样品杆2560
Fischione三维重构冷冻传输样品杆2550
Fischione全自动电解双喷仪110
Fischione精密凹坑仪200
Fischione手动研磨盘160
Fischione圆片打孔器130
Fischione超声波切割仪170
Fischione氩离子抛光仪1061
Fischione双束精修系统1080
制样/消解设备
Fischione等离子清洗仪1020
Fischione纳米等离子清洗仪1070
LatticeGear背划式划片系统FlipScribe 100
LatticeGear上划式划片系统FlipScribe
ibss样品杆存储检漏等离子清洗多功能系统Chiaro
ibss移动式等离子清洗系统MCA
ibss在线等离子清洗系统GV10x
Fischione离子减薄仪1051
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技术优势:
> Simultaneously cleans transmission and scanning electron microscope specimens and specimen holders
> Enhances imaging and analytical results
> Removes existing carbonaceous contamination
> Prevents contamination
> No etching or sputtering
> Storage in clean vacuum
Simultaneously cleans electron microscopy specimens and holders
The Plasma Cleaner automatically and quickly removes organic contamination (hydrocarbon) from electron microscopy specimens and specimen holders. A low energy, reactive gas plasma cleans without changing the specimen’s elemental composition or structural characteristics. The Plasma Cleaner features easy-to-use front panel controls and an oil-free vacuum system for optimal processing.
Enhanced imaging and analysis
Cleaning is solely by reactive gas compounds formed by the plasma chemically reacting with carbonaceous material on the specimen and specimen holder. The nonequilibrium, high-frequency plasma is generated with a gas mixture of 25% oxygen and 75% argon. Free electrons are accelerated to high velocities by an oscillating electromagnetic field (13.56 MHz) that excites gas atoms and creates the plasma. The plasma ions impinge upon the surface with energies of less than 12 eV, which is below the specimen’s sputtering threshold.
In electron microscopes with high brightness electron sources, specimens that are not plasma treated tend to contaminate. The Plasma Cleaner ensures confidence that carbonaceous contamination will not interfere with imaging or analysis, even during fine probe microanalysis for extended periods.
Standard and specialized specimen holders
The Plasma Cleaner readily accepts side-entry specimen holders for all commercial transmission electron microscopes, as well as scanning electron microscope samples and a wide variety of bulk materials. A specialized specimen holder port allows the cleaning of specimens contained on carbon